Ask a Librarian

Threre are lots of ways to contact a librarian. Choose what works best for you.

HOURS TODAY

10:00 am - 3:00 pm

Reference Desk

CONTACT US BY PHONE

(802) 656-2022

Voice

(802) 503-1703

Text

MAKE AN APPOINTMENT OR EMAIL A QUESTION

Schedule an Appointment

Meet with a librarian or subject specialist for in-depth help.

Email a Librarian

Submit a question for reply by e-mail.

WANT TO TALK TO SOMEONE RIGHT AWAY?

Library Hours for Thursday, April 25th

All of the hours for today can be found below. We look forward to seeing you in the library.
HOURS TODAY
8:00 am - 12:00 am
MAIN LIBRARY

SEE ALL LIBRARY HOURS
WITHIN HOWE LIBRARY

MapsM-Th by appointment, email govdocs@uvm.edu

Media Services8:00 am - 7:00 pm

Reference Desk10:00 am - 3:00 pm

OTHER DEPARTMENTS

Special Collections10:00 am - 6:00 pm

Dana Health Sciences Library7:30 am - 11:00 pm

 

CATQuest

Search the UVM Libraries' collections

UVM Theses and Dissertations

Browse by Department
Format:
Print
Author:
Wang, Wenjie
Dept./Program:
Materials Science Program
Year:
2010
Degree:
Ph. D.
Abstract:
Polymeric fibers are highly oriented semi-crystalline materials. High performance fibers with smaller diameter and fewer defects have higher strength than bulk materials. Carbon nanotubes (CNTs) or nanofibers (CNFs) have exceptionally high tensile strength modulus. Polymer fibers reinforced with CNTs or CNFs as nano-fillers are one of the most promising nanocomposites. To fully benefit from the unique mechanical properties of these nano-fillers, a better understanding of reinforcing mechanisms, especially load-transfer between matrix and fillers, is critical. X-ray scattering/diffraction is an ideal tool to look into the structure and morphology of materials over the length scale 1 nm to 100 nm. Synchtrotron x-ray radiation with its high brilliance enables in-situ dynamic measurement and is an effective method to monitor the structural and morphological chances in materials with hierarchical structure. Two-dimensional (2D) scattering data that are obtained from fibers need to be properly analyzed to fully characterize the hierarchical structure. In the work described in this dissertation, in situ small-angle x-ray scattering (SAXS) and wide-angle x-ray scattering (WAXS) were obtained during tensile deformation of solution-spun and gel-spun polyacrylonitrile (PAN) fibers with or without nano-reinforcement. 2D elliptical analyses methods were developed to extract the significant features of 2D x-ray scattering data and correlated to structure and morphology of the fiber. The WAXS showed PAN to have zigzag and helical conformation that are intimately associated to the crystal lattice. It was found that the presence of nano-fillers alter the structure of polymer matrix at the molecular scale. At 10-100 nm length scale, the PAN filament can be modeled as fibrils with crystalline, amorphous domains and voids. These voids provide the electron density contrast for SAXS. PAN has non-lamellar structure that results in diffuse SAXS patterns. It was found that the voids were surrounded by fibrils and oriented the same manner as crystals. Processing conditions and fillers affect the distribution, size and behaviors of voids. These structural details enhance our understanding of the factors that control the ultimate mechanical properties of nano-reinforced polymer fibers.